Circular economy of ITO thin films deposited on glass obtained from degraded OLED devices

Autores

  • Emerson Roberto Santos Universidade de São Paulo - Escola Politecnica - Engenharia Metalúrgica e de Materiais – São Paulo (SP), Brazil/ Laboratório SuperCriativo – São Paulo (SP), Brazil.
  • Lucas Henrique Silva de Jesus Faculdade de Tecnologia de São Paulo - Curso de Microeletrônica – São Paulo (SP), Brazil
  • Elvo Calixto Burini Junior Universidade de São Paulo - Instituto de Energia e Ambiente – São Paulo (SP), Brazil.
  • Roberto Koji Onmori Universidade de São Paulo - Escola Politecnica - Engenharia Elétrica – São Paulo (SP), Brazil.
  • Wang Shu Hui Universidade de São Paulo - Escola Politecnica - Engenharia Metalúrgica e de Materiais – São Paulo (SP), Brazil.

DOI:

https://doi.org/10.17563/rbav.v40i1.1209

Resumo

In this work, circular economy was investigated for commercial indium tin oxide (ITO) thin films deposited on glass substrates obtained from degraded organic light-emitting diodes (OLED). These devices were assembled and polarized at laboratory in a previous work. For each substrate, with geometry 2.5 × 2.5 cm, four OLEDs with active area of 3 × 3 mm were set up. These OLED devices were assembled with ITO as the electrode anode and successive depositions of other materials (layer-by-layer), to form the complete structure. To obtain the recovered ITO, all layers were removed from the samples containing the OLEDs previously mounted, remaining only the ITO thin films, that were cleaned with commercial product together with the received ITO/glass samples. Both samples were compared using some techniques, such as: colorimetry, electrical resistance, and Raman spectroscopy. A methodology with light-emitting diode (LED) device polarized emitting light crossing the ITO thin films was used, and the luminance with chromaticity coordinates was obtained, revealing the good transparency of the thin films. Electrical resistance of recovered ITO revealed five higher orders of magnitude in comparison to the one of received ITO. This fact can be tributed to a poly(3,4-ethylenedioxythiophene) doped with poly(styrenesulfonate) (PEDOT:PSS) layer, causing corrosion of the ITO thin films during the assembly of OLEDs or loss of the field lines created during the electrical measurements by probes of four-point probe. Raman spectroscopy did not show satisfactory results in the chemical composition analyses of the samples, but it indicated good cleaning process of the samples before the analyses.

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2021-08-30 — Atualizado em 2021-09-01

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